[JPE] Real-Time Test-Bed System Development Using Power Hardware-in-the-Loop (PHIL) Simulation Technique for Reliability Test of DC Nano Grid

Kyung-Wook Heo, Hyun-Jun Choi, and Jee-Hoon Jung, “Real-Time Test-Bed System Development Using Power Hardware-in-the-Loop (PHIL) Simulation Technique for Reliability Test of DC Nano Grid​​​,” Journal of Power Electronics, Accepted, Feb. 2020